搜索包含 Symposium on Computer Software Engineering (1976 : New York) 的图书 - 暨南大学图书馆

大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 Symposium on Computer Software Engineering (1976 : New York) 的图书(共10474本)

	Logic in computer science : modelling and reasoning about systems 0 索取号：TP301/E991 作者：Huth、 Michael、 1962-、Ryan、 Mark、 1962-、出版社：New York : Cambridge University Press, 1999.		Only connect : shaping networks and knowledge for the new millennium 0 索取号：G20/E20001.2 作者：Haywood、 Trevor、 1943-、Adair、S.ed.、出版社：London ; New Providence, N.J. : Bowker-Saur, 1999.
	Handbook for electronics engineering technicians 0 索取号：TN-62/E903.2 作者：出版社：New York : McGraw-Hill, 1984.		Propagation engineering : third in a series : 18-20 April 1990, Orlando, Florida 0 索取号：TN011-53/E991/1990 作者：出版社：Bellingham, Wash., USA : SPIE, c1990.
	Submillimeter wave : proceedings of the symposium 0 索取号：TN018-53/E802 作者：Symposium on Submillimeter Waves、 New York、 1970.、Fox、 Jerome、 ed.、Schlam、 Mark Howard、 ed.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、出版社：Brooklyn, N.Y., Polytechnic Press; [distributors: Wiley Interscience, 1971		Microwave system engineering principles 0 索取号：TN019.2/E804 作者：Raff、 Samuel J.、出版社：Oxford ; New York : Pergamon Press, c1977.
	Digest : 1979 IEEE MTT-S International Microwave Symposium 0 索取号：TN019.2-7/E801/1979 作者：IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、出版社：New York : Institute of Electrical and Electronics Engineers, c1979		Electronics engineering for professional engineers' examinations 0 索取号：TN1-44/E901 作者：Hafer、 Charles R.、 1938-、出版社：New York : McGraw-Hill, 1980.
	Proceedings [electronic resource] : energy and information technologies in the Southeast : Southeastcon, April 1-4, 1990, conference and exhibit, Doubletree Hotel, New Orleans, LA. v. 1 0 索取号：TN1-53/E901/1990.1 作者：IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1989		Proceedings [electronic resource] : energy and information technologies in the Southeast : Southeastcon, April 1-4, 1990, conference and exhibit, Doubletree Hotel, New Orleans, LA. v. 2 0 索取号：TN1-53/E901/1990.2 作者：IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1989
	Proceedings [electronic resource] : energy and information technologies in the Southeast : Southeastcon, April 1-4, 1990, conference and exhibit, Doubletree Hotel, New Orleans, LA. v. 3 0 索取号：TN1-53/E901/1990.3 作者：IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1989		Rational fault analysis 0 索取号：TN106/E802 作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、出版社：New York : M. Dekker, 1977.
	Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope 0 索取号：TN153-53/E804/1974 作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、出版社：Chicago Ill. : IIT Research Institute, 1973.		Electronic transition lasers II : proceedings of the third Summer Colloquium on Electronic Transition Lasers, held at Snowmass Village, Colorado, September 7 through 10, 1976 0 索取号：TN24-53/E801/2 作者：Summer Colloquium on Electronic Transition Lasers、 3d、 Snowmass、 Colo.、 1976.、Wilson、 Leroy E.、Suchard、 S. N.、Steinfeld、 Jeffrey I.、出版社：Cambridge, Mass. : MIT Press, 1977.
	Semiconductor devices for power conditioning 0 索取号：TN303-53/E901/1981 作者：Brown Boveri Symposium on Semiconductor Devices for Power Conditioning (1981 : Brown Boveri Research Center)、Sittig、 Roland.、Roggwiller、 P.、出版社：New York : Plenum Press, 1982.		Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985 0 索取号：TN304-53/E901/1985 作者：International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 : Montpellier、 France)、Fillard、 J. P.、出版社：Amsterdam ; New York : Elsevier, 1985.

	Logic in computer science : modelling and reasoning about systems 0 索取号：TP301/E991 作者：Huth、 Michael、 1962-、Ryan、 Mark、 1962-、出版社：New York : Cambridge University Press, 1999.		Only connect : shaping networks and knowledge for the new millennium 0 索取号：G20/E20001.2 作者：Haywood、 Trevor、 1943-、Adair、S.ed.、出版社：London ; New Providence, N.J. : Bowker-Saur, 1999.
	Handbook for electronics engineering technicians 0 索取号：TN-62/E903.2 作者：出版社：New York : McGraw-Hill, 1984.		Propagation engineering : third in a series : 18-20 April 1990, Orlando, Florida 0 索取号：TN011-53/E991/1990 作者：出版社：Bellingham, Wash., USA : SPIE, c1990.
	Submillimeter wave : proceedings of the symposium 0 索取号：TN018-53/E802 作者：Symposium on Submillimeter Waves、 New York、 1970.、Fox、 Jerome、 ed.、Schlam、 Mark Howard、 ed.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、出版社：Brooklyn, N.Y., Polytechnic Press; [distributors: Wiley Interscience, 1971		Microwave system engineering principles 0 索取号：TN019.2/E804 作者：Raff、 Samuel J.、出版社：Oxford ; New York : Pergamon Press, c1977.
	Digest : 1979 IEEE MTT-S International Microwave Symposium 0 索取号：TN019.2-7/E801/1979 作者：IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、出版社：New York : Institute of Electrical and Electronics Engineers, c1979		Electronics engineering for professional engineers' examinations 0 索取号：TN1-44/E901 作者：Hafer、 Charles R.、 1938-、出版社：New York : McGraw-Hill, 1980.
	Proceedings [electronic resource] : energy and information technologies in the Southeast : Southeastcon, April 1-4, 1990, conference and exhibit, Doubletree Hotel, New Orleans, LA. v. 1 0 索取号：TN1-53/E901/1990.1 作者：IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1989		Proceedings [electronic resource] : energy and information technologies in the Southeast : Southeastcon, April 1-4, 1990, conference and exhibit, Doubletree Hotel, New Orleans, LA. v. 2 0 索取号：TN1-53/E901/1990.2 作者：IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1989
	Proceedings [electronic resource] : energy and information technologies in the Southeast : Southeastcon, April 1-4, 1990, conference and exhibit, Doubletree Hotel, New Orleans, LA. v. 3 0 索取号：TN1-53/E901/1990.3 作者：IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1989		Rational fault analysis 0 索取号：TN106/E802 作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、出版社：New York : M. Dekker, 1977.
	Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope 0 索取号：TN153-53/E804/1974 作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、出版社：Chicago Ill. : IIT Research Institute, 1973.		Electronic transition lasers II : proceedings of the third Summer Colloquium on Electronic Transition Lasers, held at Snowmass Village, Colorado, September 7 through 10, 1976 0 索取号：TN24-53/E801/2 作者：Summer Colloquium on Electronic Transition Lasers、 3d、 Snowmass、 Colo.、 1976.、Wilson、 Leroy E.、Suchard、 S. N.、Steinfeld、 Jeffrey I.、出版社：Cambridge, Mass. : MIT Press, 1977.
	Semiconductor devices for power conditioning 0 索取号：TN303-53/E901/1981 作者：Brown Boveri Symposium on Semiconductor Devices for Power Conditioning (1981 : Brown Boveri Research Center)、Sittig、 Roland.、Roggwiller、 P.、出版社：New York : Plenum Press, 1982.		Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985 0 索取号：TN304-53/E901/1985 作者：International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 : Montpellier、 France)、Fillard、 J. P.、出版社：Amsterdam ; New York : Elsevier, 1985.